Design For Test, Senior Engineer (and above)

LinkedIn|Quest Global|Ho Chi Minh City, Vietnam|19 Aug 2026
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JOB DESCRIPTION

Job Description

At Quest Global, it’s not just what we do but how and why we do it that makes us different. With over 25 years as an engineering services provider, we believe in the power of doing things differently to make the impossible possible. Our people are driven by the desire to make the world a better place—to make a positive difference that contributes to a brighter future. We bring together technologies and industries, alongside the contributions of diverse individuals who are empowered by an intentional workplace culture, to solve problems better and faster.


Key Responsibilities

  • Conduct DFT Engineering Tasks: DFT Audit/Scan Logic/MBIST Logic/BSCAN Logic Insertion
  • Responsible for implementing the Hardware Design-for-Test (DFT) features that support ATE, in-system test, debug and diagnostics needs of the design
  • Responsible for development of innovative DFT IP in collaboration with cross-functional teams, and play a key role in full chip design integration with the testability features integrated in RTL
  • Work closely with the design/design-verification and physical design teams to enable the integration and validation of the Test logic in all phases of the design, and back-end implementation flow
  • Analyze timing report and suggest for the solution
  • Skillful in gate-level simulations with and without timing annotations
  • Diagnose and analyze data logs during silicon bring-up phase to finalize prototype patterns
  • Be responsible for Innovative Hardware DFT for new silicon device models, bare die & stacked die- driving re-usable test and debug strategies

Work Experience

  • At least 4+ years of DFT engineering experience
  • Good understanding DFT and Clock Architecture and DFT Concepts
  • Experience with whole-chip DFT with different flows: fully Tessent Shell flow, hybrid flow (mixed vendor tools) …
  • Knowledge about industrial standards and practices in DFT, including ATPG, JTAG, MBIST and trade-offs between Test quality and Test time
  • Experience developing DFT specifications and driving DFT architecture and methods for designs
  • Experience in debugging Compressed ATPG patterns, MBIST, and JTAG/1500 related issues
  • Be able to SDC build timing constraints for SCAN, MBIST, IJTAG modes and analyze timing report
  • Good knowledge of functional safety, clock domain crossing analysis, logic synthesis and scan insertion